Memristor read-write test circuit and test method

The invention relates to a memristor read-write test circuit and a test method, and the test circuit is composed of a pulse generation card, an array card and a signal acquisition card, and the array card is used for directly realizing the carrying of different memristor arrays to be tested so as to be used for testing. After the signal acquisition card is configured to be in a read/write mode, the upper computer starts a trigger test, and the pulse generation card sends a read-write pulse DAC setting signal and a grid voltage control pulse signal; a gate voltage control pulse signal turns on all MOS switch tubes on a selected column in the memristor array through the array card, a read-write pulse DAC setting signal is applied to a selected row in the memristor array through the array card, and a selected column line transmits a column output signal to a signal acquisition card through the array card for acquisition. And the read-write function test result is transmitted to the upper computer for processing