Task efficiency-oriented test factor level analysis method and device and electronic equipment
The invention provides a test factor level analysis method and device oriented to task efficiency and electronic equipment. The analysis method comprises the steps that all potential test factors capable of influencing the task efficiency are determined; determining controllable potential test facto...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a test factor level analysis method and device oriented to task efficiency and electronic equipment. The analysis method comprises the steps that all potential test factors capable of influencing the task efficiency are determined; determining controllable potential test factors in the potential test factors; determining a first factor level set, wherein the first factor level set comprises an interval range of factor levels, capable of influencing task efficiency, of each controllable potential test factor; determining a second factor level set, wherein the second factor level set comprises the interval range of the factor level of each controllable potential test factor which can be provided by the test environment; determining overlapped factor levels in the first factor level set and the second factor level set; the ratio of the number of the overlapped factor levels to the number of the factor levels in the first factor level set is calculated, the ratio is defined as the test cove |
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