Function coverage rate collection method and device, equipment and storage medium
The invention discloses a function coverage rate collection method and device, equipment and a storage medium, and belongs to the technical field of coverage rate collection. The method comprises the following steps: performing randomization constraint on a to-be-tested chip by using a preset hardwa...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a function coverage rate collection method and device, equipment and a storage medium, and belongs to the technical field of coverage rate collection. The method comprises the following steps: performing randomization constraint on a to-be-tested chip by using a preset hardware platform to obtain a randomization constraint result; obtaining a target use case through the randomization constraint result, and carrying out statistics on the target use case to obtain an incentive coverage rate; when the preset hardware platform is used for simulation compiling, obtaining a feedback signal value of the to-be-tested chip; obtaining a feedback coverage rate according to the feedback signal value; according to the method, the functional coverage rate collection of the to-be-tested chip is completed through the excitation coverage rate and the feedback coverage rate, the functional coverage rate is collected by using a preset hardware platform, and different collection modes are adopted for the |
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