Method for predicting storage life of electromagnetic relay under small subsample condition

The invention discloses a method for predicting the storage life of an electromagnetic relay under a small subsample condition. The method comprises the following steps: step 1, acquiring a certain degradation performance parameter of the electromagnetic relay; 2, preprocessing the degradation perfo...

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Hauptverfasser: LI JIUXIN, HE TIANYANG, WANG ZHAOBIN, MA DONGKUN, ZHANG WENXING, ZHU JIAMIAO, LI SHAOFEI
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a method for predicting the storage life of an electromagnetic relay under a small subsample condition. The method comprises the following steps: step 1, acquiring a certain degradation performance parameter of the electromagnetic relay; 2, preprocessing the degradation performance parameters; 3, performing sample expansion on the test samples through the TimeGAN network, and supplementing the samples with high quality evaluation into the test samples; step 4, constructing a POA-GRNN prediction model in combination with the optimized POA algorithm; 5, training a prediction model by using the test sample obtained in the step 3; 6, predicting the degradation performance parameters through the prediction model, and integrating and fusing the predicted degradation performance parameters by using an averaging method; and 7, obtaining a storage life curve of the electromagnetic relay through the index form function of the storage life prediction of the electromagnetic relay, and completing l