Method and system for measuring high-frequency responsivity of photoelectric detector and related device
The invention discloses a method, a system and a related device for measuring the high-frequency responsivity of a photoelectric detector, and relates to the technical field of parameter measurement of photoelectric detectors, and the method comprises the following steps: carrying out envelope modul...
Gespeichert in:
Hauptverfasser: | , , , , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The invention discloses a method, a system and a related device for measuring the high-frequency responsivity of a photoelectric detector, and relates to the technical field of parameter measurement of photoelectric detectors, and the method comprises the following steps: carrying out envelope modulation on a microwave high-frequency signal by using a fixed low-frequency signal to obtain an envelope modulation signal; an optical signal is modulated in an electro-optical intensity modulator and then is input into a detected photoelectric detector for photoelectric conversion to obtain a photoelectric conversion signal, the power of a required frequency component is measured, and the high and low frequency relative responsivity ratio of the detected photoelectric detector is calculated according to the power. Then calculating to obtain the low-frequency responsivity of the detected photoelectric detector; and the high-frequency responsivity of the detected photoelectric detector can be accurately calculated acc |
---|