Method for determining arbitrary Gaussian orthographic projection parameter with minimum area projection deformation
The invention belongs to the field of precision engineering measurement, and particularly relates to a method for determining arbitrary Gaussian orthographic projection parameters with minimum area projection deformation, which comprises the following steps of: calculating comprehensive area project...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention belongs to the field of precision engineering measurement, and particularly relates to a method for determining arbitrary Gaussian orthographic projection parameters with minimum area projection deformation, which comprises the following steps of: calculating comprehensive area projection deformation delta S of a measurement area; calculating the optimal distance Y0 from the central meridian; calculating the distance delta lE from the distance Ym'from the central meridian of any Gaussian orthographic projection to the projection reference position of the measuring area to the east side of the measuring area; calculating a range [Y'min, Y 'max] after projection of the measurement area by using the calculated delta lE; calculating a projection reference position Yg according to the post-projection range [Y'min, Y 'max]; inversely calculating the longitude of the new central meridian by using the projection reference position Yg and the distance delta Y between the new central meridian and the orig |
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