Precise crop per unit yield estimation method based on phenological characteristics
The invention relates to the technical field of crop cultivation, in particular to a phenological characteristic-based crop precise per unit yield estimation method, which comprises the following steps of: analyzing cultivated land yield of a to-be-measured region over the years and climate characte...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to the technical field of crop cultivation, in particular to a phenological characteristic-based crop precise per unit yield estimation method, which comprises the following steps of: analyzing cultivated land yield of a to-be-measured region over the years and climate characteristics of the region over the years to obtain influence factors of crop yield; meanwhile, illumination parameters of the current sowing year are obtained according to the sowing accumulated temperature and the active accumulated temperature of the current sowing year, so that fixed partial carbon data of the crops after photosynthesis of the solar radiation crops are obtained; and finally, establishing a model according to a comparison result of the crop yield influence factors, the phenological parameter influence factors over the years and the phenological parameter influence factors of the current sowing year, the sowing accumulated temperature and the active accumulated temperature of the current planting year |
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