TEST SYSTEM FOR DETECTING FAULT IN MULTIPLE DEVICES OF THE SAME TYPE
A method of testing a plurality of devices of the same type includes randomly generating stimulation parameters; applying the generated stimulation parameters to a plurality of devices; measuring a response to the generated stimulation parameter to generate a response output, and calculating a defec...
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| creator | SCHAT JAN-PETER WIELAGE, PAUL |
| description | A method of testing a plurality of devices of the same type includes randomly generating stimulation parameters; applying the generated stimulation parameters to a plurality of devices; measuring a response to the generated stimulation parameter to generate a response output, and calculating a defect likelihood of the test set based on a mean value and a standard deviation of the reference set response output and a mean value and a standard deviation of the test set response output; determining that the defect likelihood is greater than a first threshold; applying an initial step of a directed random search algorithm to update the stimulation parameter in response to determining that the defect likelihood is greater than the first threshold; applying the updated stimulation parameters to the plurality of devices; measuring a response to the updated stimulation parameter to produce an updated response output; calculating the defect likelihood of the test set based on the mean value and the standard deviation o |
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| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | TEST SYSTEM FOR DETECTING FAULT IN MULTIPLE DEVICES OF THE SAME TYPE |
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