TEST SYSTEM FOR DETECTING FAULT IN MULTIPLE DEVICES OF THE SAME TYPE

A method of testing a plurality of devices of the same type includes randomly generating stimulation parameters; applying the generated stimulation parameters to a plurality of devices; measuring a response to the generated stimulation parameter to generate a response output, and calculating a defect likelihood of the test set based on a mean value and a standard deviation of the reference set response output and a mean value and a standard deviation of the test set response output; determining that the defect likelihood is greater than a first threshold; applying an initial step of a directed random search algorithm to update the stimulation parameter in response to determining that the defect likelihood is greater than the first threshold; applying the updated stimulation parameters to the plurality of devices; measuring a response to the updated stimulation parameter to produce an updated response output; calculating the defect likelihood of the test set based on the mean value and the standard deviation o