Method for calculating uncertainty of automatic metrological verification system and computer equipment

The invention discloses a method for calculating uncertainty of an automatic metrological verification system, which comprises the following steps of: S1, analyzing a hardware structure system of a metrological verification system, and researching a source of the uncertainty of measurement equipment...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	CHEN MINYA, ZHANG HAIRUI, WANG KUN, XIA JUNBO, FENG YADONG, MOU YIZHE, ZHANG QIANPING, LI ZHONG, SHI CHENHANG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!