Method for calculating uncertainty of automatic metrological verification system and computer equipment
The invention discloses a method for calculating uncertainty of an automatic metrological verification system, which comprises the following steps of: S1, analyzing a hardware structure system of a metrological verification system, and researching a source of the uncertainty of measurement equipment...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a method for calculating uncertainty of an automatic metrological verification system, which comprises the following steps of: S1, analyzing a hardware structure system of a metrological verification system, and researching a source of the uncertainty of measurement equipment introduced by the hardware structure system; s2, according to a test software structure of the metrological verification system, analyzing a mathematical model adopted by a software structure system and a source of uncertainty of test equipment introduced by programming; s3, by taking the measurement function of the metrological verification system as an object, analyzing a measurement model, a test channel composition and a measurement error source of a system measurement chain; and S4, determining an uncertainty evaluation method of each test item according to the composition and the working mode of the test channels in the S3. According to the method, the calculation of the uncertainty of the automatic metrolog |
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