Method for calculating uncertainty of automatic metrological verification system and computer equipment
The invention discloses a method for calculating uncertainty of an automatic metrological verification system, which comprises the following steps of: S1, analyzing a hardware structure system of a metrological verification system, and researching a source of the uncertainty of measurement equipment...
Gespeichert in:
| Hauptverfasser: | , , , , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | CHEN MINYA ZHANG HAIRUI WANG KUN XIA JUNBO FENG YADONG MOU YIZHE ZHANG QIANPING LI ZHONG SHI CHENHANG |
| description | The invention discloses a method for calculating uncertainty of an automatic metrological verification system, which comprises the following steps of: S1, analyzing a hardware structure system of a metrological verification system, and researching a source of the uncertainty of measurement equipment introduced by the hardware structure system; s2, according to a test software structure of the metrological verification system, analyzing a mathematical model adopted by a software structure system and a source of uncertainty of test equipment introduced by programming; s3, by taking the measurement function of the metrological verification system as an object, analyzing a measurement model, a test channel composition and a measurement error source of a system measurement chain; and S4, determining an uncertainty evaluation method of each test item according to the composition and the working mode of the test channels in the S3. According to the method, the calculation of the uncertainty of the automatic metrolog |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN118293966A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN118293966A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN118293966A3</originalsourceid><addsrcrecordid>eNqNirEKwjAQQLs4iPoP5wc41EKxoxTFRSf3cqSXGkjuYnIR-vd28AOc3oP31tV0J33JCFYSGPSmeFTHExQ2lBQd6wxiAYtKWIqBQJrEy-SWGz6UnF1MnTDkOSsFQB7BSIhFKQG9i4uBWLfVyqLPtPtxU-2vl2d_O1CUgXJEQ0w69I-6Ph27pmvbc_PP8wVrq0Ft</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method for calculating uncertainty of automatic metrological verification system and computer equipment</title><source>esp@cenet</source><creator>CHEN MINYA ; ZHANG HAIRUI ; WANG KUN ; XIA JUNBO ; FENG YADONG ; MOU YIZHE ; ZHANG QIANPING ; LI ZHONG ; SHI CHENHANG</creator><creatorcontrib>CHEN MINYA ; ZHANG HAIRUI ; WANG KUN ; XIA JUNBO ; FENG YADONG ; MOU YIZHE ; ZHANG QIANPING ; LI ZHONG ; SHI CHENHANG</creatorcontrib><description>The invention discloses a method for calculating uncertainty of an automatic metrological verification system, which comprises the following steps of: S1, analyzing a hardware structure system of a metrological verification system, and researching a source of the uncertainty of measurement equipment introduced by the hardware structure system; s2, according to a test software structure of the metrological verification system, analyzing a mathematical model adopted by a software structure system and a source of uncertainty of test equipment introduced by programming; s3, by taking the measurement function of the metrological verification system as an object, analyzing a measurement model, a test channel composition and a measurement error source of a system measurement chain; and S4, determining an uncertainty evaluation method of each test item according to the composition and the working mode of the test channels in the S3. According to the method, the calculation of the uncertainty of the automatic metrolog</description><language>chi ; eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240705&DB=EPODOC&CC=CN&NR=118293966A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240705&DB=EPODOC&CC=CN&NR=118293966A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHEN MINYA</creatorcontrib><creatorcontrib>ZHANG HAIRUI</creatorcontrib><creatorcontrib>WANG KUN</creatorcontrib><creatorcontrib>XIA JUNBO</creatorcontrib><creatorcontrib>FENG YADONG</creatorcontrib><creatorcontrib>MOU YIZHE</creatorcontrib><creatorcontrib>ZHANG QIANPING</creatorcontrib><creatorcontrib>LI ZHONG</creatorcontrib><creatorcontrib>SHI CHENHANG</creatorcontrib><title>Method for calculating uncertainty of automatic metrological verification system and computer equipment</title><description>The invention discloses a method for calculating uncertainty of an automatic metrological verification system, which comprises the following steps of: S1, analyzing a hardware structure system of a metrological verification system, and researching a source of the uncertainty of measurement equipment introduced by the hardware structure system; s2, according to a test software structure of the metrological verification system, analyzing a mathematical model adopted by a software structure system and a source of uncertainty of test equipment introduced by programming; s3, by taking the measurement function of the metrological verification system as an object, analyzing a measurement model, a test channel composition and a measurement error source of a system measurement chain; and S4, determining an uncertainty evaluation method of each test item according to the composition and the working mode of the test channels in the S3. According to the method, the calculation of the uncertainty of the automatic metrolog</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNirEKwjAQQLs4iPoP5wc41EKxoxTFRSf3cqSXGkjuYnIR-vd28AOc3oP31tV0J33JCFYSGPSmeFTHExQ2lBQd6wxiAYtKWIqBQJrEy-SWGz6UnF1MnTDkOSsFQB7BSIhFKQG9i4uBWLfVyqLPtPtxU-2vl2d_O1CUgXJEQ0w69I-6Ph27pmvbc_PP8wVrq0Ft</recordid><startdate>20240705</startdate><enddate>20240705</enddate><creator>CHEN MINYA</creator><creator>ZHANG HAIRUI</creator><creator>WANG KUN</creator><creator>XIA JUNBO</creator><creator>FENG YADONG</creator><creator>MOU YIZHE</creator><creator>ZHANG QIANPING</creator><creator>LI ZHONG</creator><creator>SHI CHENHANG</creator><scope>EVB</scope></search><sort><creationdate>20240705</creationdate><title>Method for calculating uncertainty of automatic metrological verification system and computer equipment</title><author>CHEN MINYA ; ZHANG HAIRUI ; WANG KUN ; XIA JUNBO ; FENG YADONG ; MOU YIZHE ; ZHANG QIANPING ; LI ZHONG ; SHI CHENHANG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN118293966A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CHEN MINYA</creatorcontrib><creatorcontrib>ZHANG HAIRUI</creatorcontrib><creatorcontrib>WANG KUN</creatorcontrib><creatorcontrib>XIA JUNBO</creatorcontrib><creatorcontrib>FENG YADONG</creatorcontrib><creatorcontrib>MOU YIZHE</creatorcontrib><creatorcontrib>ZHANG QIANPING</creatorcontrib><creatorcontrib>LI ZHONG</creatorcontrib><creatorcontrib>SHI CHENHANG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHEN MINYA</au><au>ZHANG HAIRUI</au><au>WANG KUN</au><au>XIA JUNBO</au><au>FENG YADONG</au><au>MOU YIZHE</au><au>ZHANG QIANPING</au><au>LI ZHONG</au><au>SHI CHENHANG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method for calculating uncertainty of automatic metrological verification system and computer equipment</title><date>2024-07-05</date><risdate>2024</risdate><abstract>The invention discloses a method for calculating uncertainty of an automatic metrological verification system, which comprises the following steps of: S1, analyzing a hardware structure system of a metrological verification system, and researching a source of the uncertainty of measurement equipment introduced by the hardware structure system; s2, according to a test software structure of the metrological verification system, analyzing a mathematical model adopted by a software structure system and a source of uncertainty of test equipment introduced by programming; s3, by taking the measurement function of the metrological verification system as an object, analyzing a measurement model, a test channel composition and a measurement error source of a system measurement chain; and S4, determining an uncertainty evaluation method of each test item according to the composition and the working mode of the test channels in the S3. According to the method, the calculation of the uncertainty of the automatic metrolog</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN118293966A |
| source | esp@cenet |
| subjects | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING |
| title | Method for calculating uncertainty of automatic metrological verification system and computer equipment |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-01T11%3A49%3A43IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CHEN%20MINYA&rft.date=2024-07-05&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN118293966A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |