Standard cell library re-characterization method and device, terminal and storage medium

The invention provides a standard cell library re-characterization method and device, a terminal and a storage medium. The standard cell library re-characterization method comprises the steps of obtaining characteristic values corresponding to all process corners of a target circuit assembly; perfor...

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Hauptverfasser: WU WEI, LIU XIANMING, E SONGTAN, LI HONGJUN
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention provides a standard cell library re-characterization method and device, a terminal and a storage medium. The standard cell library re-characterization method comprises the steps of obtaining characteristic values corresponding to all process corners of a target circuit assembly; performing regression analysis on the characteristic values corresponding to the process corners to obtain a regression equation, and performing differentiation on the regression equation to obtain an inflection point coordinate; and determining a target voltage and a target temperature according to the inflection point coordinates, and re-characterizing the standard cell library according to the target voltage and the target temperature. According to the method, the regression equation is constructed through the characteristic values of all the process corners, the coordinates of the inflection points are obtained, the characteristic values on the inflection points are greatly changed, and the voltage and the temperatur