Test result atlas retest system of probe station and retest method of test result atlas retest system
The invention discloses a test result atlas retest system of a probe station and a retest method thereof, and the system comprises a control module which is connected with the probe station; the acquisition module is used for acquiring an original map and is connected to the control module; the reco...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a test result atlas retest system of a probe station and a retest method thereof, and the system comprises a control module which is connected with the probe station; the acquisition module is used for acquiring an original map and is connected to the control module; the recognition module is used for recognizing bad image blocks in the original map and is connected to the acquisition module; the replacement module is used for replacing the bad image blocks in the original map with the to-be-detected image blocks and is connected to the recognition module; the acquisition module is used for acquiring a retest map for retesting the chip at the corresponding position of the to-be-tested block by the probe station, and is connected to the control module; and the replacement module is used for updating the chip retest result to the bad image blocks of the original image so as to obtain an updated image, and is connected with the acquisition module, the acquisition module and the control mo |
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