Equivalent test method for verifying large-scale impact reliability of electronic device

The invention provides an equivalent test method for verifying the large-scale impact reliability of an electronic device. The equivalent test method comprises the following steps: (1) pre-impact: adjusting impact equipment parameters to about the magnitude required by a test; (2) calculating impact energy levels, impact directions and impact times of the small-energy-level and short-pulse-width impacts by utilizing a relationship that instantaneous power and total energy of the small-energy-level and short-pulse-width impacts are equal to that of the large-energy-level and long-pulse-width impacts; and (3) equivalent impact test: continuously carrying out impact test on the electronic device to be detected in different directions according to the parameters solved in the step (2). Multiple continuous small-energy-level and short-pulse-width impact tests are equivalent to large-scale and long-pulse-width impact tests. 本发明提供一种验证电子器件大量级冲击可靠性的等效试验方法，包括：(1)预冲击：调整冲击设备参数至约为试验需要的量级；(2)利用小能级、短脉宽冲击的瞬时功率和总能量与大量级、长脉宽冲击相