Autonomous detection of insertion of memory into test device without power supply

An apparatus, system, and method for reducing memory product test failures includes a memory tester that tracks a frequency at which a memory product is inserted into a memory product receiving component of the memory tester, and when a count reaches or exceeds a threshold, the memory tester receives the memory product from the memory product receiving component. The information is used to trigger a replacement memory product receiving component. The electronics may be arranged to increase the count even when the memory tester is powered down, the memory product is inserted into the memory product receiving component. 一种用于减少存储器产品测试故障的装置、系统和方法，包括存储器测试仪，该存储器测试仪跟踪存储器产品被插入到该存储器测试仪的存储器产品接收部件中的频率，并且当计数达到或超过阈值时，使用该信息来触发替换存储器产品接收部件。该电子器件可以被布置成即使在存储器测试仪断电时，存储器产品被插入存储器产品接收部件中，也增加该计数。