Multi-spectral-line structured light cooperative measurement method and device

The invention discloses a multi-spectral-line structured light collaborative measurement method, which comprises the following specific steps of: adjusting the type of a semiconductor material, and controlling the wavelength of laser emitted by a laser; a point light source emitted by the laser is c...

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Bibliographische Detailangaben
Hauptverfasser: MU YUANBO, WEN JIANQI, LI ZHIMING, WU MIN, LIU YANG, WANG HUAJIE, WU DAIJIE, ZHENG JIZHONG, LI RIYING, LING ZHEN, DAI PENG, ZHANG SHIJIE, MAO QINGZHOU
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a multi-spectral-line structured light collaborative measurement method, which comprises the following specific steps of: adjusting the type of a semiconductor material, and controlling the wavelength of laser emitted by a laser; a point light source emitted by the laser is changed into linear structured light; an optical filter is assembled on the imaging sensor, and it is ensured that reflected laser rays of the laser rays of the specific spectrum band enter the imaging sensor; screening the received reflected laser rays through an adaptive threshold algorithm, and extracting the position of a laser center line; calibrating the extracted center laser to realize three-dimensional measurement; performing spatial calibration and coordinate conversion on the imaging sensors to enable the measurement data of the plurality of imaging sensors to be consistent; integrating the obtained coordinate transformation parameters, and converting data obtained from different imaging sensors into a gl