Short-wave infrared binocular detector non-uniformity correction method and system for intelligent sorting

The invention provides a short-wave infrared binocular detector non-uniformity correction method and system for intelligent sorting. The short-wave infrared binocular detector non-uniformity correction method comprises the following steps: S1, collecting short-wave infrared irradiance response data...

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Hauptverfasser: FU ZHIJING, WAN WENZE, PAN MINGZHONG, ZHU JIANGMIN, LIU DI, ZENG CHENCHEN, GU CHENGXIN, CAO YIPENG
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creator FU ZHIJING
WAN WENZE
PAN MINGZHONG
ZHU JIANGMIN
LIU DI
ZENG CHENCHEN
GU CHENGXIN
CAO YIPENG
description The invention provides a short-wave infrared binocular detector non-uniformity correction method and system for intelligent sorting. The short-wave infrared binocular detector non-uniformity correction method comprises the following steps: S1, collecting short-wave infrared irradiance response data and integrating sphere standard irradiance data; s2, determining non-uniformity correction parameters of the binocular detector according to the data in the step S1; s3, performing real-time non-uniformity correction by adopting an FPGA non-uniformity correction circuit according to the non-uniformity correction parameters in the step S2; s4, judging the consistency of the binocular detector according to negative feedback of the system, calculating a consistency correction parameter, and comparing the consistency of the corrected data through correlation analysis such as standard deviation; and S5, according to the consistency correction parameter, performing real-time correction by using an FPGA correction circuit
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subjects COLORIMETRY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
TESTING
title Short-wave infrared binocular detector non-uniformity correction method and system for intelligent sorting
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