Short-wave infrared binocular detector non-uniformity correction method and system for intelligent sorting
The invention provides a short-wave infrared binocular detector non-uniformity correction method and system for intelligent sorting. The short-wave infrared binocular detector non-uniformity correction method comprises the following steps: S1, collecting short-wave infrared irradiance response data...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a short-wave infrared binocular detector non-uniformity correction method and system for intelligent sorting. The short-wave infrared binocular detector non-uniformity correction method comprises the following steps: S1, collecting short-wave infrared irradiance response data and integrating sphere standard irradiance data; s2, determining non-uniformity correction parameters of the binocular detector according to the data in the step S1; s3, performing real-time non-uniformity correction by adopting an FPGA non-uniformity correction circuit according to the non-uniformity correction parameters in the step S2; s4, judging the consistency of the binocular detector according to negative feedback of the system, calculating a consistency correction parameter, and comparing the consistency of the corrected data through correlation analysis such as standard deviation; and S5, according to the consistency correction parameter, performing real-time correction by using an FPGA correction circuit |
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