Crystal oscillator for double-chip single-particle test
The invention provides a crystal oscillator for a double-chip single-particle test, which comprises a second resonance module arranged on a base, a second chip arranged on the second resonance module, a first resonance module and the second resonance module arranged on the base in parallel at an int...
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| creator | SHEN QING DUAN YOUFENG SUI JIANPING ZHENG WENQIANG YANG XIAOJIE JIA XIAOLONG MA TENGYUAN |
| description | The invention provides a crystal oscillator for a double-chip single-particle test, which comprises a second resonance module arranged on a base, a second chip arranged on the second resonance module, a first resonance module and the second resonance module arranged on the base in parallel at an interval, the first resonance module and the second resonance module are located on the same axis, the first resonance module and the second resonance module are respectively provided with different frequency output ends for signal measurement, and the first resonance module and the second resonance module can be placed at the same time due to the unique arrangement of the base, so that the single particle test can be carried out on the two chips at the same time. And according to the signals correspondingly detected by the different frequency output ends in real time and on line, whether the signals meet the test requirements or not is judged, so that the test cost is reduced, and the test efficiency is improved.
本发明 |
| format | Patent |
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本发明</description><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>ELECTRICITY</subject><subject>GENERATION OF NOISE BY SUCH CIRCUITS</subject><subject>GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING,BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN ANON-SWITCHING MANNER</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDB3LqosLknMUcgvTs7MyUksyS9SSAPilPzSpJxU3eSMzAKF4sy8dCC7ILGoJDM5J1WhJLW4hIeBNS0xpziVF0pzMyi6uYY4e-imFuTHpxYXJCan5qWWxDv7GRpaGBkbWZgYOhoTowYA9bkuLg</recordid><startdate>20240621</startdate><enddate>20240621</enddate><creator>SHEN QING</creator><creator>DUAN YOUFENG</creator><creator>SUI JIANPING</creator><creator>ZHENG WENQIANG</creator><creator>YANG XIAOJIE</creator><creator>JIA XIAOLONG</creator><creator>MA TENGYUAN</creator><scope>EVB</scope></search><sort><creationdate>20240621</creationdate><title>Crystal oscillator for double-chip single-particle test</title><author>SHEN QING ; DUAN YOUFENG ; SUI JIANPING ; ZHENG WENQIANG ; YANG XIAOJIE ; JIA XIAOLONG ; MA TENGYUAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN118232841A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>ELECTRICITY</topic><topic>GENERATION OF NOISE BY SUCH CIRCUITS</topic><topic>GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING,BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN ANON-SWITCHING MANNER</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SHEN QING</creatorcontrib><creatorcontrib>DUAN YOUFENG</creatorcontrib><creatorcontrib>SUI JIANPING</creatorcontrib><creatorcontrib>ZHENG WENQIANG</creatorcontrib><creatorcontrib>YANG XIAOJIE</creatorcontrib><creatorcontrib>JIA XIAOLONG</creatorcontrib><creatorcontrib>MA TENGYUAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SHEN QING</au><au>DUAN YOUFENG</au><au>SUI JIANPING</au><au>ZHENG WENQIANG</au><au>YANG XIAOJIE</au><au>JIA XIAOLONG</au><au>MA TENGYUAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Crystal oscillator for double-chip single-particle test</title><date>2024-06-21</date><risdate>2024</risdate><abstract>The invention provides a crystal oscillator for a double-chip single-particle test, which comprises a second resonance module arranged on a base, a second chip arranged on the second resonance module, a first resonance module and the second resonance module arranged on the base in parallel at an interval, the first resonance module and the second resonance module are located on the same axis, the first resonance module and the second resonance module are respectively provided with different frequency output ends for signal measurement, and the first resonance module and the second resonance module can be placed at the same time due to the unique arrangement of the base, so that the single particle test can be carried out on the two chips at the same time. And according to the signals correspondingly detected by the different frequency output ends in real time and on line, whether the signals meet the test requirements or not is judged, so that the test cost is reduced, and the test efficiency is improved.
本发明</abstract><oa>free_for_read</oa></addata></record> |
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| language | chi ; eng |
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| subjects | BASIC ELECTRONIC CIRCUITRY ELECTRICITY GENERATION OF NOISE BY SUCH CIRCUITS GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING,BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN ANON-SWITCHING MANNER MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Crystal oscillator for double-chip single-particle test |
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