Crystal oscillator for double-chip single-particle test

The invention provides a crystal oscillator for a double-chip single-particle test, which comprises a second resonance module arranged on a base, a second chip arranged on the second resonance module, a first resonance module and the second resonance module arranged on the base in parallel at an int...

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Bibliographische Detailangaben
Hauptverfasser: SHEN QING, DUAN YOUFENG, SUI JIANPING, ZHENG WENQIANG, YANG XIAOJIE, JIA XIAOLONG, MA TENGYUAN
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention provides a crystal oscillator for a double-chip single-particle test, which comprises a second resonance module arranged on a base, a second chip arranged on the second resonance module, a first resonance module and the second resonance module arranged on the base in parallel at an interval, the first resonance module and the second resonance module are located on the same axis, the first resonance module and the second resonance module are respectively provided with different frequency output ends for signal measurement, and the first resonance module and the second resonance module can be placed at the same time due to the unique arrangement of the base, so that the single particle test can be carried out on the two chips at the same time. And according to the signals correspondingly detected by the different frequency output ends in real time and on line, whether the signals meet the test requirements or not is judged, so that the test cost is reduced, and the test efficiency is improved. 本发明