Automatic station inspection method based on BIM model and electronic equipment

The invention discloses a BIM model-based automatic station inspection method and electronic equipment, and the method comprises the steps: determining a to-be-inspected region in response to a region configuration operation of a user in an inspection task configuration page; determining a first ins...

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Bibliographische Detailangaben
Hauptverfasser: LI FANGJUAN, LAN TIAN, LI JUN, ZHANG XIAOTAO, QU ZHENGQIANG, WANG SHIYAO, TANG LIANBO, XING CHUNYANG, WANG YIHUA, LI HAILONG, XUE HONGYAN, LIU JIJIAN, FAN XIXUAN
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a BIM model-based automatic station inspection method and electronic equipment, and the method comprises the steps: determining a to-be-inspected region in response to a region configuration operation of a user in an inspection task configuration page; determining a first inspection device included in the to-be-inspected area according to the size of the to-be-inspected area and the position of the first target point of each inspection device; for each visual device, determining a second inspection device included in the visual area of the visual device; determining a first visual device matched with the to-be-inspected area according to a first inspection device included in the to-be-inspected area and a second inspection device included in the visual area of each visual device; according to the relationship between the type of the inspection equipment and the task type and the relationship between the type of the inspection equipment and the inspection mode, constructing an inspectio