Test chamber

Test chamber

The present invention relates to a test chamber comprising: a chamber main body having an accommodating space which is open on one side and accommodates a test board on which an electronic component is loaded; and a temperature adjusting device for adjusting the temperature of the electronic compone...

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Hauptverfasser: SON SEUNG-PYO, NOH JONG-KI, NA YUN-SUNG, HEO SUNG-WOOK
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator SON SEUNG-PYO
NOH JONG-KI
NA YUN-SUNG
HEO SUNG-WOOK
description The present invention relates to a test chamber comprising: a chamber main body having an accommodating space which is open on one side and accommodates a test board on which an electronic component is loaded; and a temperature adjusting device for adjusting the temperature of the electronic component loaded on the test board housed in the chamber main body, in which the chamber main body has: a support rail for supporting the test board housed in the housing space, the support rail being provided so as to be divided into: a first region for supporting the test board housed in the housing space, and a second region for supporting the test board housed in the housing space; if the test board is accommodated in the accommodating space, the temperature of the accommodating space is adjusted through the temperature adjusting device; and a second region separated from the first region, the electronic component loaded on the test board being exposed to the first region side, the second region being blocked by the t
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language chi ; eng
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Test chamber
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