Test chamber
The present invention relates to a test chamber comprising: a chamber main body having an accommodating space which is open on one side and accommodates a test board on which an electronic component is loaded; and a temperature adjusting device for adjusting the temperature of the electronic compone...
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| Hauptverfasser: | , , , |
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| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
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| Zusammenfassung: | The present invention relates to a test chamber comprising: a chamber main body having an accommodating space which is open on one side and accommodates a test board on which an electronic component is loaded; and a temperature adjusting device for adjusting the temperature of the electronic component loaded on the test board housed in the chamber main body, in which the chamber main body has: a support rail for supporting the test board housed in the housing space, the support rail being provided so as to be divided into: a first region for supporting the test board housed in the housing space, and a second region for supporting the test board housed in the housing space; if the test board is accommodated in the accommodating space, the temperature of the accommodating space is adjusted through the temperature adjusting device; and a second region separated from the first region, the electronic component loaded on the test board being exposed to the first region side, the second region being blocked by the t |
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