Automatic parameter adjusting device, automatic parameter adjusting system and automatic parameter adjusting method

The present disclosure relates to techniques for efficiently and automatically searching for control parameters for a device. One embodiment of the present disclosure relates to an apparatus for automatically adjusting parameters, comprising: a plurality of device models obtained by modeling devices...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: ARAI TAKESHI, SATO TAICHI, TAKAYANAGI SHUN, SHIRAKATA NAGANORI, TSUKIZAWA TAKAYUKI
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The present disclosure relates to techniques for efficiently and automatically searching for control parameters for a device. One embodiment of the present disclosure relates to an apparatus for automatically adjusting parameters, comprising: a plurality of device models obtained by modeling devices; a control parameter setting unit that sets a plurality of first control parameters for a first attempt with respect to the plurality of device models, and sets a second control parameter for the first attempt with respect to the device; and a comparison unit that compares model operation results in the first attempt of the plurality of device models using the plurality of first control parameters and real machine operation results in the first attempt of the devices using the second control parameters. The control parameter setting unit selects a control parameter to be used in a second attempt on the basis of a first comparison result of a model operation result in the first attempt and a real machine operation