After-class learning quality evaluation method and device

The invention discloses an after-class learning quality evaluation method and device, and the method comprises the steps: obtaining the after-class learning quality parameters of students, calculating the after-class learning quality of each student based on an ant colony algorithm improved support...

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Hauptverfasser: SHAO LIN, GU XIUMEI, LU JING, CHEN CAIZHEN, YANG LIU, HU GAOBO
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses an after-class learning quality evaluation method and device, and the method comprises the steps: obtaining the after-class learning quality parameters of students, calculating the after-class learning quality of each student based on an ant colony algorithm improved support vector machine model, building a learning quality influence model between student groups, and carrying out the evaluation of the after-class learning quality. And correcting the after-class learning quality in combination with the learning quality influence model among the student groups, obtaining a group learning result according to the corrected individual learning quality, and performing trend prediction according to the after-class learning quality of each course and generating a curve. Objective evaluation of the after-class learning quality of the students is realized, the after-class learning quality calculation result of the students is corrected in combination with the learning quality influence model amo