Ground surface settlement deformation measurement correction method and device based on correlation analysis, equipment and medium
The invention discloses a method, a device, equipment and a medium for measuring and correcting ground surface settlement deformation based on correlation analysis, and the method comprises the steps: obtaining a multi-scene single-baseline full-aperture SAR (Synthetic Aperture Radar) image distribu...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The invention discloses a method, a device, equipment and a medium for measuring and correcting ground surface settlement deformation based on correlation analysis, and the method comprises the steps: obtaining a multi-scene single-baseline full-aperture SAR (Synthetic Aperture Radar) image distributed according to a time sequence of a research region, constructing a plurality of groups of full-aperture image pairs and corresponding foresight and rearview sub-aperture image pairs; carrying out interference processing and removing a flat ground phase, a terrain phase corresponding to a naked earth surface and an orbit error phase to obtain a differential interference phase; performing correlation analysis on the differential interference phases of the foresight and the rearview by using wavelet decomposition, and removing terrain residual errors and noise phases; performing correlation analysis on two differential interferograms which are adjacent in time sequence and free of time crossing, extracting a common |
---|