In-situ fretting fatigue test device and method based on synchrotron radiation light source
The invention relates to an in-situ fretting fatigue test device and method based on a synchrotron radiation light source, and belongs to the technical field of fretting fatigue tests. The test device comprises an axial fatigue loading system and a micro-motion loading system, wherein the axial fati...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to an in-situ fretting fatigue test device and method based on a synchrotron radiation light source, and belongs to the technical field of fretting fatigue tests. The test device comprises an axial fatigue loading system and a micro-motion loading system, wherein the axial fatigue loading system is used for realizing axial fatigue of a sample and generating axial micro-displacement; and the fretting loading system realizes fretting fatigue of the sample through close contact between a fixed fretting pad and the sample and combined action with the axial loading system. The in-situ fretting fatigue test device placed on the light source sample rotating table can be matched with a synchrotron radiation light source to carry out imaging and diffraction characterization on a sample, and damage defects such as cracks and the like and a residual stress evolution rule in a fretting fatigue loading process can be visually characterized in real time in situ; the internal damage evolution character |
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