Transient irradiation testing device for multi-channel transistor

The invention discloses a multi-channel transistor transient irradiation testing device, which comprises a testing cylinder mounting disc, and is characterized in that the testing cylinder mounting disc is mounted on a sliding table; the test cylinder mounting disc is an arc-shaped disc, at least one test cylinder mounting hole is formed in the test cylinder mounting disc, the at least one test cylinder mounting hole is equidistantly distributed around the circle center of the test cylinder mounting disc, a test cylinder is mounted in each test cylinder mounting hole, and each test cylinder points to a laser plasma pulse radiation source. The radiation shielding device has the beneficial effects that when the radiation test is carried out on the transistor, radiation shielding can be carried out on electronic components except the transistor, and the radiation test accuracy of the transistor is improved. 本发明公开了一种多通道晶体管瞬态辐照测试装置，包括有测试筒安装盘，所述测试筒安装盘安装在滑台上；所述测试筒安装盘为弧形盘，该测试筒安装盘上开有至少1个测试筒安装孔，至少1个所述测试筒安装孔围绕所述测试筒安装盘圆心