ICP (Inductively Coupled Plasma) determination method of available boron

The invention relates to the technical field of boron element extraction and purification, and particularly discloses an ICP (Inductively Coupled Plasma) determination method of available boron. The ICP method is used for replacing a spectrophotometric method for analysis, and interference caused by...

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Bibliographische Detailangaben
Hauptverfasser: CUI CANCAN, CHEN HAO, DAI ZHENGBO, RUI QIANQIAN, HU SIHAN, HU JIAWEI, TAO SHAOBO, ZHAO LIWEI
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention relates to the technical field of boron element extraction and purification, and particularly discloses an ICP (Inductively Coupled Plasma) determination method of available boron. The ICP method is used for replacing a spectrophotometric method for analysis, and interference caused by iron ions is overcome by adding the iron ion adsorbent, so that the defect that the spectrophotometric method is easily influenced by external factors is avoided to a certain extent, the detection process is simplified, and the detection efficiency is improved. Therefore, the detection of the effective boron content can be carried out under the condition of less interference, and the detection precision of the effective boron content is improved. 本申请涉及硼元素提取纯化技术领域,具体公开了一种有效硼的ICP测定方法。本申请使用ICP法代替分光光度法进行分析,并通过铁离子吸附剂的加入克服了铁离子造成的干扰,从而在一定程度上规避了分光光度法容易受外界因素影响的缺陷,还精简了检测流程,使得对有效硼含量的检测能够在干扰较少的条件下进行,提高了有效硼含量检测的精密度。