Display chip test system and method

The embodiment of the invention provides a display chip test system. The display chip test system comprises an FPGA (Field Programmable Gate Array) and an LED (Light Emitting Diode) array, wherein the LED array comprises a group of LEDs which are arranged in order; the FPGA is used for converting to-be-tested scanning algorithm data into data information of the storage module and storing the data information into the storage module; wherein the storage module comprises a plurality of storage units, and each storage unit is in one-to-one correspondence with one LED in the LED array; and the FPGA is also used for reading the data information stored by the storage module, and controlling the corresponding LEDs to be lightened based on the data information in each storage unit, so as to test the scanning algorithm to be tested based on the lightening of the LED array. The test scheme is simple and easy to implement, and has the characteristics of low cost and short period. In addition, the embodiment of the inven