Test piece for IPM test and clamp thereof

The invention discloses a tester for an IPM test and a clamp thereof. Two testers for the IPM test can be stacked to form a test tester group; a plurality of contact pins of the two IPM testing testers in one testing testers group abut against the testing board, the testing board is a circuit board...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	HUO JIAJUN, LIAO WEIQIANG, ZHANG WEIQI, CHI ZHENHUA
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	BASIC ELECTRIC ELEMENTS CURRENT COLLECTORS ELECTRICITY LINE CONNECTORS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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