Test piece for IPM test and clamp thereof

The invention discloses a tester for an IPM test and a clamp thereof. Two testers for the IPM test can be stacked to form a test tester group; a plurality of contact pins of the two IPM testing testers in one testing testers group abut against the testing board, the testing board is a circuit board...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: HUO JIAJUN, LIAO WEIQIANG, ZHANG WEIQI, CHI ZHENHUA
Format: Patent
Sprache:chi ; eng
Schlagworte:
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Beschreibung
Zusammenfassung:The invention discloses a tester for an IPM test and a clamp thereof. Two testers for the IPM test can be stacked to form a test tester group; a plurality of contact pins of the two IPM testing testers in one testing testers group abut against the testing board, the testing board is a circuit board which is a PVC printed circuit board, a copper layer is printed on the circuit board, and the plurality of contact pins are pressed against the copper layer of the testing board. A plurality of pressure testing elastic arms of the two IPM testing testers can abut against a plurality of input pins in a one-to-one correspondence mode under the driving of the clamp, and then the IPM can be tested, namely, two testing points are designed for a testing machine circuit so that a loop can be formed to test the contact resistance value, the IPM is specifically a formed IPM, and the testing efficiency of the IPM is greatly improved. Therefore, the problem that an existing tester cannot be suitable for testing after the IPM