Test circuit of semiconductor device and test system including same

The invention relates to a test circuit of a semiconductor device and a test system including the same. A test circuit of a semiconductor device includes a first resistor, a second resistor, and a feedback loop circuit. The first resistor is coupled between the pad and the test element. The second resistor is coupled in parallel to the first resistor. The feedback loop circuit is configured to feed back a result to the second resistor, the result being a result of comparing a first voltage and a second voltage to each other, the first voltage and the second voltage being applied to the first resistor and the second resistor, respectively. 本申请涉及半导体设备的测试电路和包括其的测试系统。一种半导体设备的测试电路包括第一电阻器、第二电阻器和反馈回路电路。第一电阻器联接在焊盘和测试元件之间。第二电阻器以并联方式联接到第一电阻器。反馈回路电路被配置为将结果反馈给第二电阻器，该结果是将第一电压和第二电压彼此比较的结果，第一电压和第二电压分别被施加到第一电阻器和第二电阻器。