Medium-high temperature creep life prediction method and device, storage medium and computer equipment
The invention discloses a medium-high temperature creep life prediction method and device, a storage medium and computer equipment. The method comprises the following steps: obtaining the yield strength and the percentage elongation after fracture of a to-be-tested material at a target temperature;...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a medium-high temperature creep life prediction method and device, a storage medium and computer equipment. The method comprises the following steps: obtaining the yield strength and the percentage elongation after fracture of a to-be-tested material at a target temperature; calculating a strength difference value between the yield strength and a preset strength error as test load strength; controlling the creep test device to perform a creep test on the to-be-tested material according to the test load strength, and determining a creep curve of the to-be-tested material at the target temperature; and according to the slope of the steady-state creep region in the creep curve, determining the creep time of plastic deformation of the to-be-tested material at the percentage elongation after fracture. According to the method disclosed by the invention, the creep stability is ensured while the test speed is accelerated, so that an accurate high-temperature creep test result can be obtained i |
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