Method and system for testing security of wafer software, equipment and medium

The invention provides a wafer software security test method and system based on demand extraction, equipment and a medium. The method comprises the steps of obtaining wafer software information of to-be-tested wafer software, searching pre-stored template wafer software which is most matched with basic functions of the to-be-tested wafer software, and splitting the pre-stored template wafer software into identified security test requirements and implicit security test requirements, and performing a security test on the to-be-tested wafer software by using the identified security test requirements and the implicit security test requirements, and outputting a wafer software test report. According to the method, the to-be-tested wafer software is subjected to the most basic classification according to the template wafer software pre-stored in the database so as to obtain the primary test requirements capable of testing the to-be-tested wafer software, and the test is performed according to different test times