Compatibility detection method

The invention discloses a compatibility detection method. The method comprises the following steps: collecting and recording test data of a test platform; loading the collected limit value of each large platform test through test equipment; after the test equipment loads the preset value, the preset...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: FENG RUOHAO, JIN SICHENG, CHEN LIN
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a compatibility detection method. The method comprises the following steps: collecting and recording test data of a test platform; loading the collected limit value of each large platform test through test equipment; after the test equipment loads the preset value, the preset value is adjusted and loaded, and the application test of each large platform test is simulated; after the pressure test and the application test both pass, the high-temperature aging test is further completed; according to the compatibility detection method, only a small-batch mainstream market platform is needed, time sequence delay limit value data tested by the mainstream market platform are sorted and collected, then time sequence delay limit data values are loaded through test equipment, and the test application effect of multiple test equipment can be achieved through a small number of test equipment; the production test cost is greatly reduced, and the product production quality is improved. 本发明公开了一种兼容性检测方