Blackbody furnace surface emissivity correction method based on Fourier spectrometer technology
The invention belongs to the technical field of material testing, and particularly relates to a blackbody furnace surface emissivity correction method based on the Fourier spectrometer technology. The method comprises the following steps: S1, acquiring the brightness temperature of the surface of th...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention belongs to the technical field of material testing, and particularly relates to a blackbody furnace surface emissivity correction method based on the Fourier spectrometer technology. The method comprises the following steps: S1, acquiring the brightness temperature of the surface of the blackbody furnace by using a non-contact temperature measurement sensor under a set narrow wave band; s2, the emissivity of the blackbody furnace at the corresponding real temperature is calculated according to the measured brightness temperature and the real temperature of the blackbody furnace; s3, measuring a radiation characteristic curve of the blackbody furnace by using a Fourier spectrometer under a set broadband; s4, determining a radiation characteristic curve of an ideal grey body corresponding to the blackbody furnace; and S5, determining the emissivity of the blackbody furnace under the set broadband. The surface source blackbody furnace emissivity correction method is accurate in measurement and wide |
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