Blackbody furnace surface emissivity correction method based on Fourier spectrometer technology

The invention belongs to the technical field of material testing, and particularly relates to a blackbody furnace surface emissivity correction method based on the Fourier spectrometer technology. The method comprises the following steps: S1, acquiring the brightness temperature of the surface of th...

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Bibliographische Detailangaben
Hauptverfasser: LI LIWEI, GE JUNFENG, ZHOU JIANJUN, FAN BOLONG, YAN JIANKUN, GUI KANG, XIAO TING, MOU YUFEI, YE LIN
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention belongs to the technical field of material testing, and particularly relates to a blackbody furnace surface emissivity correction method based on the Fourier spectrometer technology. The method comprises the following steps: S1, acquiring the brightness temperature of the surface of the blackbody furnace by using a non-contact temperature measurement sensor under a set narrow wave band; s2, the emissivity of the blackbody furnace at the corresponding real temperature is calculated according to the measured brightness temperature and the real temperature of the blackbody furnace; s3, measuring a radiation characteristic curve of the blackbody furnace by using a Fourier spectrometer under a set broadband; s4, determining a radiation characteristic curve of an ideal grey body corresponding to the blackbody furnace; and S5, determining the emissivity of the blackbody furnace under the set broadband. The surface source blackbody furnace emissivity correction method is accurate in measurement and wide