Material width measuring method and device

The embodiment of the invention provides a material width measuring method and device, and the method comprises the steps: collecting a material image under the condition of producing a target material; acquiring a virtual pixel array based on the material image and a virtual pixel determination met...

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Bibliographische Detailangaben
Hauptverfasser: YANG MU, CAO JINGZHONG
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The embodiment of the invention provides a material width measuring method and device, and the method comprises the steps: collecting a material image under the condition of producing a target material; acquiring a virtual pixel array based on the material image and a virtual pixel determination method; determining a target pixel from the virtual pixel array, and determining a width coefficient of the target pixel; and determining the width of the target material based on the width coefficient. The method comprises the steps of collecting a material image under the condition of producing a target material; acquiring a virtual pixel array based on the material image and a virtual pixel determination method; determining a target pixel from the virtual pixel array, and determining a width coefficient of the target pixel; the width of the target material is determined based on the width coefficient, the measurement precision is improved, and the manufacturing cost is reduced. 本说明书实施例提供材料宽度测量方法及装置,其中材料宽度测量方法包括:在生产