PROBE HEAD, VERTICAL PROBE, AND METHOD FOR MANUFACTURING VERTICAL PROBE

A probe head includes a probe seat and a plurality of vertical probes, a probe head of each vertical probe includes a probe tip section and a probe head mounting section located between a probe body and the probe tip section and partially protruding out of a lower surface of the probe seat, and the...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: LIN JINYI, WANG CHAOSHUN, FAN LIMING, JIAN ZIHAO, CHEN ZIYANG
Format: Patent
Sprache:chi ; eng
Schlagworte:
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Beschreibung
Zusammenfassung:A probe head includes a probe seat and a plurality of vertical probes, a probe head of each vertical probe includes a probe tip section and a probe head mounting section located between a probe body and the probe tip section and partially protruding out of a lower surface of the probe seat, and the probe tip section includes a probe tip contact portion. The needle tip reducing part is located between the needle head mounting section and the needle tip contact part, the first width of the needle head mounting section is larger than the second width of the needle tip contact part, the needle tip reducing part is gradually reduced from the first width to the second width, and the first length of the needle tip reducing part is smaller than the second length of the needle tip contact part; the length of the probe head installation section protruding out of the lower surface of the probe seat is smaller than the sum of the first and second lengths. The vertical probe provided by the invention has good current resi