Lead frame surface defect detection method and system

Lead frame surface defect detection method and system

The invention provides a lead frame surface defect detection method and system, and relates to the technical field of detection, and the method comprises the steps: collecting a lead frame image, inputting the preprocessed lead frame image into a defect extraction network, carrying out the down-samp...

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Hauptverfasser: YAN XUQIANG, REN YUE, YIN GUOQIN, REN ZHONGPING
Format: Patent
Sprache:chi ; eng
Schlagworte:
CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator YAN XUQIANG
REN YUE
YIN GUOQIN
REN ZHONGPING
description The invention provides a lead frame surface defect detection method and system, and relates to the technical field of detection, and the method comprises the steps: collecting a lead frame image, inputting the preprocessed lead frame image into a defect extraction network, carrying out the down-sampling of the lead frame image through a feature layering network, and obtaining a shallow feature image set and a deep feature image set; the shallow feature image set passes through a parallel convolution module to obtain a defect detail enhancement image set, and the deep feature image set passes through a serial convolution module to obtain a defect semantic enhancement image set; inputting the defect detail enhancement image set and the defect semantic enhancement image set into a feature fusion module, carrying out superposition along channel dimensions, carrying out cavity convolution operation according to an expansion rate, and carrying out corresponding position pixel superposition and point convolution fus
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN118052817A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN118052817A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN118052817A3</originalsourceid><addsrcrecordid>eNrjZDD1SU1MUUgrSsxNVSguLUpLTE5VSElNS00uAVIlQCozP08hN7UkIz9FITEvRaG4srgkNZeHgTUtMac4lRdKczMourmGOHvophbkx6cWFwBNyUstiXf2MzS0MDA1sjA0dzQmRg0AQpEs6w</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Lead frame surface defect detection method and system</title><source>esp@cenet</source><creator>YAN XUQIANG ; REN YUE ; YIN GUOQIN ; REN ZHONGPING</creator><creatorcontrib>YAN XUQIANG ; REN YUE ; YIN GUOQIN ; REN ZHONGPING</creatorcontrib><description>The invention provides a lead frame surface defect detection method and system, and relates to the technical field of detection, and the method comprises the steps: collecting a lead frame image, inputting the preprocessed lead frame image into a defect extraction network, carrying out the down-sampling of the lead frame image through a feature layering network, and obtaining a shallow feature image set and a deep feature image set; the shallow feature image set passes through a parallel convolution module to obtain a defect detail enhancement image set, and the deep feature image set passes through a serial convolution module to obtain a defect semantic enhancement image set; inputting the defect detail enhancement image set and the defect semantic enhancement image set into a feature fusion module, carrying out superposition along channel dimensions, carrying out cavity convolution operation according to an expansion rate, and carrying out corresponding position pixel superposition and point convolution fus</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240517&amp;DB=EPODOC&amp;CC=CN&amp;NR=118052817A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240517&amp;DB=EPODOC&amp;CC=CN&amp;NR=118052817A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YAN XUQIANG</creatorcontrib><creatorcontrib>REN YUE</creatorcontrib><creatorcontrib>YIN GUOQIN</creatorcontrib><creatorcontrib>REN ZHONGPING</creatorcontrib><title>Lead frame surface defect detection method and system</title><description>The invention provides a lead frame surface defect detection method and system, and relates to the technical field of detection, and the method comprises the steps: collecting a lead frame image, inputting the preprocessed lead frame image into a defect extraction network, carrying out the down-sampling of the lead frame image through a feature layering network, and obtaining a shallow feature image set and a deep feature image set; the shallow feature image set passes through a parallel convolution module to obtain a defect detail enhancement image set, and the deep feature image set passes through a serial convolution module to obtain a defect semantic enhancement image set; inputting the defect detail enhancement image set and the defect semantic enhancement image set into a feature fusion module, carrying out superposition along channel dimensions, carrying out cavity convolution operation according to an expansion rate, and carrying out corresponding position pixel superposition and point convolution fus</description><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDD1SU1MUUgrSsxNVSguLUpLTE5VSElNS00uAVIlQCozP08hN7UkIz9FITEvRaG4srgkNZeHgTUtMac4lRdKczMourmGOHvophbkx6cWFwBNyUstiXf2MzS0MDA1sjA0dzQmRg0AQpEs6w</recordid><startdate>20240517</startdate><enddate>20240517</enddate><creator>YAN XUQIANG</creator><creator>REN YUE</creator><creator>YIN GUOQIN</creator><creator>REN ZHONGPING</creator><scope>EVB</scope></search><sort><creationdate>20240517</creationdate><title>Lead frame surface defect detection method and system</title><author>YAN XUQIANG ; REN YUE ; YIN GUOQIN ; REN ZHONGPING</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN118052817A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YAN XUQIANG</creatorcontrib><creatorcontrib>REN YUE</creatorcontrib><creatorcontrib>YIN GUOQIN</creatorcontrib><creatorcontrib>REN ZHONGPING</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YAN XUQIANG</au><au>REN YUE</au><au>YIN GUOQIN</au><au>REN ZHONGPING</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Lead frame surface defect detection method and system</title><date>2024-05-17</date><risdate>2024</risdate><abstract>The invention provides a lead frame surface defect detection method and system, and relates to the technical field of detection, and the method comprises the steps: collecting a lead frame image, inputting the preprocessed lead frame image into a defect extraction network, carrying out the down-sampling of the lead frame image through a feature layering network, and obtaining a shallow feature image set and a deep feature image set; the shallow feature image set passes through a parallel convolution module to obtain a defect detail enhancement image set, and the deep feature image set passes through a serial convolution module to obtain a defect semantic enhancement image set; inputting the defect detail enhancement image set and the defect semantic enhancement image set into a feature fusion module, carrying out superposition along channel dimensions, carrying out cavity convolution operation according to an expansion rate, and carrying out corresponding position pixel superposition and point convolution fus</abstract><oa>free_for_read</oa></addata></record>
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subjects CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Lead frame surface defect detection method and system
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-10T23%3A29%3A12IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=YAN%20XUQIANG&rft.date=2024-05-17&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN118052817A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true