Lead frame surface defect detection method and system
The invention provides a lead frame surface defect detection method and system, and relates to the technical field of detection, and the method comprises the steps: collecting a lead frame image, inputting the preprocessed lead frame image into a defect extraction network, carrying out the down-samp...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a lead frame surface defect detection method and system, and relates to the technical field of detection, and the method comprises the steps: collecting a lead frame image, inputting the preprocessed lead frame image into a defect extraction network, carrying out the down-sampling of the lead frame image through a feature layering network, and obtaining a shallow feature image set and a deep feature image set; the shallow feature image set passes through a parallel convolution module to obtain a defect detail enhancement image set, and the deep feature image set passes through a serial convolution module to obtain a defect semantic enhancement image set; inputting the defect detail enhancement image set and the defect semantic enhancement image set into a feature fusion module, carrying out superposition along channel dimensions, carrying out cavity convolution operation according to an expansion rate, and carrying out corresponding position pixel superposition and point convolution fus |
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