Semiconductor device junction temperature on-line detection system and method and controller
The invention discloses a semiconductor device junction temperature on-line detection system and method and a controller, the system comprises a controller, an on-line measurement circuit and a detection module used for extracting saturated drain current information of a device to be detected, one e...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a semiconductor device junction temperature on-line detection system and method and a controller, the system comprises a controller, an on-line measurement circuit and a detection module used for extracting saturated drain current information of a device to be detected, one end of the on-line measurement circuit is connected with the drain of the device to be detected, and the other end of the on-line measurement circuit is connected with the controller. The other end of the on-line measuring circuit is connected with the source electrode of the device to be measured; when the to-be-measured device enters the saturation region to work, an energy storage element in the online measurement circuit automatically injects current into the drain electrode of the to-be-measured device, so that the drain electrode current of the to-be-measured device rises; the controller is connected with the detection module, the controller determines the junction temperature of the to-be-detected device acco |
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