Small sample low-temperature electrical property test board

The invention discloses a low-temperature electrical property test bench for a small sample, and relates to a low-temperature bench for testing electrical properties of materials. The invention aims to solve the problem that the existing method cannot test the electrical low-temperature test data of the electrocaloric effect of the thin and small-size functional ceramic. The low-temperature electrical property test board for the small sample comprises a temperature control system and a to-be-tested sample test system, the temperature control system comprises an assembly lower base, an assembly vertical plate, a nitrogen input hole, a threading hole, an oblique square air outlet hole, an operation table outer cover, an operation table air outlet hole, a thermocouple insertion opening, an assembly upper cover plate, an internally-closed heat preservation liquid nitrogen barrel, a multi-layer dumbbell-shaped heat conduction structure, a heat conduction connecting rod, a plate-shaped copper block with a groove an