Ultra-wide bandgap semiconductor diode with multi-region JTE structure
The invention discloses an ultra-wide bandgap semiconductor diode with a multi-region JTE structure. The ultra-wide bandgap semiconductor diode comprises a substrate layer, an epitaxial layer, a dielectric layer, a cathode metal layer, a JTE region and an anode metal layer, wherein the epitaxial lay...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | HUANG SHUYANG ZHANG JINPING ZHANG BO DENG HAONAN |
description | The invention discloses an ultra-wide bandgap semiconductor diode with a multi-region JTE structure. The ultra-wide bandgap semiconductor diode comprises a substrate layer, an epitaxial layer, a dielectric layer, a cathode metal layer, a JTE region and an anode metal layer, wherein the epitaxial layer and the substrate layer are made of a first ultra-wide bandgap semiconductor material; the JTE region is a second ultra-wide forbidden band semiconductor and forms a heterojunction structure with the epitaxial layer to improve electric field distribution and optimize device performance. According to the invention, the heterojunction is formed at the edge of the cellular region of the device by utilizing multiple times of photoetching and deposition technologies of the positive photoresist, so that the multi-region JTE structure with the mesa is formed. According to the structure, the electric field concentration phenomenon caused by the curvature effect of the device can be relieved or even eliminated through th |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN118016729A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN118016729A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN118016729A3</originalsourceid><addsrcrecordid>eNrjZHALzSkpStQtz0xJVUhKzEtJTyxQKE7NzUzOz0spTS7JL1JIycwHypVnlmQo5JbmlGTqFqWmZ-bnKXiFuCoUlxQBFZUWpfIwsKYl5hSn8kJpbgZFN9cQZw_d1IL8-NTigsTk1LzUknhnP0NDCwNDM3MjS0djYtQAADq3M64</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Ultra-wide bandgap semiconductor diode with multi-region JTE structure</title><source>esp@cenet</source><creator>HUANG SHUYANG ; ZHANG JINPING ; ZHANG BO ; DENG HAONAN</creator><creatorcontrib>HUANG SHUYANG ; ZHANG JINPING ; ZHANG BO ; DENG HAONAN</creatorcontrib><description>The invention discloses an ultra-wide bandgap semiconductor diode with a multi-region JTE structure. The ultra-wide bandgap semiconductor diode comprises a substrate layer, an epitaxial layer, a dielectric layer, a cathode metal layer, a JTE region and an anode metal layer, wherein the epitaxial layer and the substrate layer are made of a first ultra-wide bandgap semiconductor material; the JTE region is a second ultra-wide forbidden band semiconductor and forms a heterojunction structure with the epitaxial layer to improve electric field distribution and optimize device performance. According to the invention, the heterojunction is formed at the edge of the cellular region of the device by utilizing multiple times of photoetching and deposition technologies of the positive photoresist, so that the multi-region JTE structure with the mesa is formed. According to the structure, the electric field concentration phenomenon caused by the curvature effect of the device can be relieved or even eliminated through th</description><language>chi ; eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240510&DB=EPODOC&CC=CN&NR=118016729A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240510&DB=EPODOC&CC=CN&NR=118016729A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HUANG SHUYANG</creatorcontrib><creatorcontrib>ZHANG JINPING</creatorcontrib><creatorcontrib>ZHANG BO</creatorcontrib><creatorcontrib>DENG HAONAN</creatorcontrib><title>Ultra-wide bandgap semiconductor diode with multi-region JTE structure</title><description>The invention discloses an ultra-wide bandgap semiconductor diode with a multi-region JTE structure. The ultra-wide bandgap semiconductor diode comprises a substrate layer, an epitaxial layer, a dielectric layer, a cathode metal layer, a JTE region and an anode metal layer, wherein the epitaxial layer and the substrate layer are made of a first ultra-wide bandgap semiconductor material; the JTE region is a second ultra-wide forbidden band semiconductor and forms a heterojunction structure with the epitaxial layer to improve electric field distribution and optimize device performance. According to the invention, the heterojunction is formed at the edge of the cellular region of the device by utilizing multiple times of photoetching and deposition technologies of the positive photoresist, so that the multi-region JTE structure with the mesa is formed. According to the structure, the electric field concentration phenomenon caused by the curvature effect of the device can be relieved or even eliminated through th</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHALzSkpStQtz0xJVUhKzEtJTyxQKE7NzUzOz0spTS7JL1JIycwHypVnlmQo5JbmlGTqFqWmZ-bnKXiFuCoUlxQBFZUWpfIwsKYl5hSn8kJpbgZFN9cQZw_d1IL8-NTigsTk1LzUknhnP0NDCwNDM3MjS0djYtQAADq3M64</recordid><startdate>20240510</startdate><enddate>20240510</enddate><creator>HUANG SHUYANG</creator><creator>ZHANG JINPING</creator><creator>ZHANG BO</creator><creator>DENG HAONAN</creator><scope>EVB</scope></search><sort><creationdate>20240510</creationdate><title>Ultra-wide bandgap semiconductor diode with multi-region JTE structure</title><author>HUANG SHUYANG ; ZHANG JINPING ; ZHANG BO ; DENG HAONAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN118016729A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>HUANG SHUYANG</creatorcontrib><creatorcontrib>ZHANG JINPING</creatorcontrib><creatorcontrib>ZHANG BO</creatorcontrib><creatorcontrib>DENG HAONAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HUANG SHUYANG</au><au>ZHANG JINPING</au><au>ZHANG BO</au><au>DENG HAONAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Ultra-wide bandgap semiconductor diode with multi-region JTE structure</title><date>2024-05-10</date><risdate>2024</risdate><abstract>The invention discloses an ultra-wide bandgap semiconductor diode with a multi-region JTE structure. The ultra-wide bandgap semiconductor diode comprises a substrate layer, an epitaxial layer, a dielectric layer, a cathode metal layer, a JTE region and an anode metal layer, wherein the epitaxial layer and the substrate layer are made of a first ultra-wide bandgap semiconductor material; the JTE region is a second ultra-wide forbidden band semiconductor and forms a heterojunction structure with the epitaxial layer to improve electric field distribution and optimize device performance. According to the invention, the heterojunction is formed at the edge of the cellular region of the device by utilizing multiple times of photoetching and deposition technologies of the positive photoresist, so that the multi-region JTE structure with the mesa is formed. According to the structure, the electric field concentration phenomenon caused by the curvature effect of the device can be relieved or even eliminated through th</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | chi ; eng |
recordid | cdi_epo_espacenet_CN118016729A |
source | esp@cenet |
subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
title | Ultra-wide bandgap semiconductor diode with multi-region JTE structure |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-14T11%3A14%3A19IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HUANG%20SHUYANG&rft.date=2024-05-10&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN118016729A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |