Method and system for predicting distribution of chip unit performance along with process corner, terminal and medium

The invention provides a method and system for predicting distribution of chip unit performance along with a process corner, a terminal and a medium, and particularly relates to the technical field of chip design, and the scheme comprises the steps: constructing a relation between the channel length...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	WU WEI, E SONGTAN, LI HONGJUN, LIN SONG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
Online-Zugang:	Volltext bestellen
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