Magnetic field scanning probe, preparation method, magnetic field measuring system and application

The invention provides a magnetic field scanning probe and a preparation method thereof, and a magnetic field measurement system and application thereof, the magnetic field scanning probe comprises an optical fiber and a nano-diamond cluster, the optical fiber has an optical fiber taper, and the nan...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	WANG YIBO, WANG XIN, OUYANG WENZHENG, FAN JINGWEI, CHEN BING, CHEN WUHUI
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING
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