Magnetic field scanning probe, preparation method, magnetic field measuring system and application

The invention provides a magnetic field scanning probe and a preparation method thereof, and a magnetic field measurement system and application thereof, the magnetic field scanning probe comprises an optical fiber and a nano-diamond cluster, the optical fiber has an optical fiber taper, and the nan...

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Hauptverfasser: WANG YIBO, WANG XIN, OUYANG WENZHENG, FAN JINGWEI, CHEN BING, CHEN WUHUI
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention provides a magnetic field scanning probe and a preparation method thereof, and a magnetic field measurement system and application thereof, the magnetic field scanning probe comprises an optical fiber and a nano-diamond cluster, the optical fiber has an optical fiber taper, and the nano-diamond cluster contains a nitrogen-vacancy color center and is fixed at the tip of the tapered optical fiber through intermolecular force; the magnetic field measurement system comprises a laser, a sample displacement table, a microwave generation unit, a light path assembly, a photon counter, a data acquisition card and a PC upper computer, wherein a data acquisition and control program is operated on the PC upper computer. The magnetic probe can be prepared conveniently and quickly, scanning magnetic imaging is performed on a scalar magnetic field in a narrow space through a method of multiple times of microwave frequency sweeping and adding of measurement results, and the magnetic probe has the advantages of