Integrated test method and system for performance of narrow-linewidth semiconductor laser

The invention discloses a narrow-linewidth semiconductor laser performance integrated test method and system, and relates to the technical field of narrow-linewidth semiconductor laser performance tests.The output light of a narrow-linewidth semiconductor laser is divided into two parts, PIV test, PIV curve drawing, PN test and PN curve drawing are conducted respectively, and therefore PIV and PN integrated test is achieved. Key parameters such as output light intensity, voltage and frequency noise of the laser can be accurately captured, the overall test period is short, the process is simple, the data accuracy is high, and the performance of the narrow-linewidth semiconductor laser can be evaluated more reliably. 本发明公开了一种窄线宽半导体激光器性能一体化测试方法及系统，涉及窄线宽半导体激光器性能测试技术领域，本发明通过将窄线宽半导体激光器的输出光一分为二，分别进行PIV测试、PIV曲线绘制和PN测试、PN曲线绘制，从而实现PIV和PN一体化测试，能够准确捕获激光器的输出光强度、电压以及频率噪声等关键参数，且测试整体周期短、过程简单、数据准确性高，可以更可靠地评估窄线宽半导体激光器的性能。