Magnetic field temperature double-parameter measuring device and method
The invention provides a magnetic field temperature double-parameter measuring device and method, and belongs to the technical field of magnetic field sensors, and the device comprises a light source, an optical circulator, a composite cavity Fabry-Perot interferometer (FPI) magnetic field sensing p...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a magnetic field temperature double-parameter measuring device and method, and belongs to the technical field of magnetic field sensors, and the device comprises a light source, an optical circulator, a composite cavity Fabry-Perot interferometer (FPI) magnetic field sensing probe, an electro-optical modulator, a dispersion element, an optical amplifier, a photoelectric detector, and a vector network analyzer. The composite cavity FPI magnetic field sensing probe is composed of a magnetostrictive alloy material, a ceramic ferrule, a first single-mode fiber and a second single-mode fiber. By means of the magnetostrictive alloy material, the air cavity structure of the composite cavity FPI is sensitive to an external magnetic field, and the silicon dioxide cavity and the air cavity of the composite cavity FPI are sensitive to external temperature. The composite cavity FPI structure, the light source, the optical circulator, the electro-optical modulator, the dispersion element, the optica |
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