Magnetic field temperature double-parameter measuring device and method

The invention provides a magnetic field temperature double-parameter measuring device and method, and belongs to the technical field of magnetic field sensors, and the device comprises a light source, an optical circulator, a composite cavity Fabry-Perot interferometer (FPI) magnetic field sensing p...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: LIU QIAN, WANG YING, ZHU MINGJIAN, GAO PUFENG, WANG MUGUANG, WANG ZIXIAO, WU BEILEI, CAI SHIYI
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The invention provides a magnetic field temperature double-parameter measuring device and method, and belongs to the technical field of magnetic field sensors, and the device comprises a light source, an optical circulator, a composite cavity Fabry-Perot interferometer (FPI) magnetic field sensing probe, an electro-optical modulator, a dispersion element, an optical amplifier, a photoelectric detector, and a vector network analyzer. The composite cavity FPI magnetic field sensing probe is composed of a magnetostrictive alloy material, a ceramic ferrule, a first single-mode fiber and a second single-mode fiber. By means of the magnetostrictive alloy material, the air cavity structure of the composite cavity FPI is sensitive to an external magnetic field, and the silicon dioxide cavity and the air cavity of the composite cavity FPI are sensitive to external temperature. The composite cavity FPI structure, the light source, the optical circulator, the electro-optical modulator, the dispersion element, the optica